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electron backscatter diffraction ebsd detector  (Oxford Instruments)


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    Oxford Instruments electron backscatter diffraction ebsd detector
    Electron Backscatter Diffraction Ebsd Detector, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 98/100, based on 1527 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/electron+backscatter+diffraction+(ebsd/Symmetry/10__1016_slash_j__surfcoat__2026__133440-54-21-28
    Average 98 stars, based on 1527 article reviews
    electron backscatter diffraction ebsd detector - by Bioz Stars, 2026-08
    98/100 stars

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    Image Search Results


    EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques:

    EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques:

    EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.

    Journal: Materials

    Article Title: Effect of Tempering Temperature on Microstructural Evolution and Mechanical Properties of Cr-Ni-Mo-V Steel for Pressure Vessel Applications

    doi: 10.3390/ma19091679

    Figure Lengend Snippet: EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.

    Article Snippet: For orientation and grain boundary analysis, specimens were electropolished in a 5% perchloric acid–ethanol solution at 15 V for 50 s. The crystal orientation and grain boundary distribution of the experimental steel were analyzed by means of an electron backscatter diffraction (EBSD) detector (EDAX Velocity Super) (EDAX LLC, Mahwah, NJ, USA), and the data acquisition step was 0.2 μm.

    Techniques: